a speed of read/write DAQ card mode change will reach 200K

HEY, man,

I have a project needs to test two points I name them point A and point B, the first time, I should point A 5V DC input, voltage inductive test point B, sencodly, give point B 5V DC input and inductive point test output voltage, this means and two analog ports must read and write sharing mode , and the test speed must be 100 KB, if I have a 200 KB data acquisition card, can the speed of read/write mode change reach 100 KB for an analog port? or, please give your suggest for my this kind of situation, thank you.

Hi API,.

I see that you are trying to measure voltages using a single channel at a time on a data acquisition card.

Unfortunately, you cannot change the inputs to the outputs or vice versa on a map of data acquisition, they are static.

What I recommend is either using a switch like this: http://sine.ni.com/nips/cds/view/p/lang/en/nid/207130 where you will need a high chassis.

Or, having four channels, 2 inputs and 2 outputs and try to measure it. You should have the necessary speed as well.

If you have any other questions, I'd be happy to answer.

Thank you very much

Tags: NI Hardware

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