In-Circuit Test (ICT) in Teststand

Hello community,

I use the material NI PXI with Dev Suite 2012 with Teststand/Switch Executive for a fitting of airbags (ICT & CTF) test.

Are there methods or software of OR or third parties for the development of ICT in my process of easier test? NOR did a great job with functional test, but is there a good way to make ICT?

I am currently using a DMM and Switch Card Guard Amp. How to write a bunch of lines of code in teststand to toggle switches on the card. Wondered if there was a simpler way.

Thank you

Kevin

A few suggestions:

(1) Executive of switch use to connect to all switches in the same appointment (see examples). This will reduce probably 5 steps for 3. You can see the link already provided.

(2) using the C language of service approach - to create a sequence of sub that tests a unique resistance:

i.e.

void / sequence: R_test (Rname, Rvalue, Rswitches, etc.) - the arguments or parameters to this sequence under decision worksheet.

Typical steps in the sequence of sub:
(a) connect all the switches - based on the argument of switches
(b) Pass fail the test - VI of appeal that did the test and returns pass fail
(c) disconnectors

(3) on the main sequence, you just call this sub for each resistance sequence.

(4) another approach in which you want to load your needs from a excel sheet, please visit property charger type of stage as well as his examples.

For this alternative:

You can create a container of Type R with variables - R.value, R.name, R.switch1toOn, R.switch1toON, etc.

Then you can create an array of Type R and export to an excel spreadsheet using tool (Tools menu) to the import\export (take the maximum of 100 more you want)

In the excel worksheet, you can update the values of R.

You will also need a more variable noofresistors, which is in the excel worksheet.

Your main sequence can be like this:

type of charger step property - download all values of container and leaf to Teststand noofresistors excel variables.

For (i =<>

{

call sequence for R checking with parameters (table [i]. (R)

}

In the above example, you should not change the sequence at all... updated values in the excellent journal.

I hope this helps.

Tags: NI Software

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    Report type is ASCII and all results must be reported

    Used RAM at the beginning: 646 MB

    Used RAM after a minut: 681 MB (+ 35 MB!)

    #Results: 4969

    ==> + 7, 21Mo/result

    Test 3:

    'on the fly of statement' option selected

    the "keep the memory and display only the most recent results" option selected

    Report type is ASCII and all results must be reported

    Used RAM at the beginning: 662 MB

    Used RAM after a minut: 681 MB (+ 19 MB!)

    #Results: 4969

    ==> + 3, 24MO/result

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    Selected by the "on the fly report" with or without the option "Maintain the memory and display only the most recent results", the RAM used by each result is greater than if you do not select the option "on the fly report." Also probably Teststand generates the report at run time, but independent more important on the parameters of the RAM option is ALWAYS increasing.

    So is this a bug or is this a feature?

    Does anyone have experience with the "on the fly report?

    Bye,.

    Risotto

    Hi Norbert,.

    Thanks, thanks and thanks again! It was the solution!

    If you set "on the fly report" + "keep memory and only display last results" AND activate 'Throw results or disable results when not required by model' then the behavior of the RAM used is as you explained: it begins to increase, but after some time remain constant.

    With her so I have a solution, very well!

    Only comments in support OR in general this option seems to be implemented in Teststand for several years (Teststand 2.0 can be?) and I spent weeks already on the search for a solution to this problem of memory. OK, maybe I was really long to understand how do, but on the other side I spend so much time reading of the documentation, speaking with the support of NOR and the support OR so past time send me examples and documentation. I think for a question like how to manage reports and the memory of test which are lasting several days, support should be able to give me an answer and it must be clear in the documentation how to make the adjustment.

    In any case, I'm happy you could have help me. Thank you once again!

    Risotto

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