Analog input noise, best way to filter?

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  I also understand that you cannot have multiple tasks running at the same time on the same material/map, otherwise you get a: 50103 error 'The specified resource is reserved.

  This is incorrect.  You can't have two tasks of the same type running on a single card.  You can have an analog input and analog output task running simultaneously on the same hardware.

  You are right that each task can have only one type of task (entry or exit).  Discover DAQmx examples in the example Finder to get examples of synchronized input and output.

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• Several analog inputs seem to change any of the other (details DAQ: 2120 BNC and 6062E)

  I use the BNC 2120 DAQ board connected to the data acquisition card 6062E to record two analog inputs. An entry is connected to ai0 and the other at ai1. Example vi: "Acq & graph int clk tension" has been used to measure the two entries with the value read NChan NSamp vi (channels being dev2 / ai0:1). The output is the top graph in the image. However, this seemed a bit strange to me that one of them should be modulating with a different frequency. When I record both entered individually (two in low pictures) they are indeed different since the entries shown in the top graph.

  

  Why this would be the case, and how can I overcome this to measure the real signals?

  Thank you!

  The E series card takes the samples as soon as possible. Thus, for example,.
  If you have 16 analog input channels but you only read of
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  After and then wait 14 'ticks '. What's that little run-in
  the origin of the afterglow.
  I think you can get the card to wait a certain
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  Its properties delay units and sampling clock delay and delay that
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  If the phase is important so the above is not the best
  the option because it causes a delay in phase. So, if you need true simultaneous
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  simultaneous sampling.

  Or, rather than the Delay property and delay units, try the Rate property
  find more > converted > rate.

  If this is not
  work either, you can move the second signal source to, say, AI8 and
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  Analyzing these data, I found that the real input sensitivity is ~9.766 mV, corresponding to levels of voltage exactly 1126,4 and ~ 10 bits.

  Is there a reason why the resolution of analog input is much lower that it is indicated on the card?  What are some of the ways I could improve the sensitivity of this measure?

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• Measure the time difference between a digital output and an analog input that responded to the questionnaire

  Hallo,

  I use the following system:

  • OR PXI-1044 with controller NI PXI-8109
  
  
  • OR PXI-2564 switch module to turn on the monitor of my test device
  
  
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  The two cards are the same - PXI trigger bus. For both, PXI-2564 and PXI-6259 I use DAQmx to set the reading and writing of the channels.

  Now, I want to measure the time between the digital output, my unit turns and the analog input, which measures the response of my system.

  I can't do work by myself, please help me!

  I thank Ludwig.

  Hi Ludwig,.

  If you can't give us any VI we have difficulties with to help you.

  Because I Donat knowledge how your program is mounted it is not easy to know where you should enter signals.

  Here's a question similar to yours:

  http://forums.NI.com/T5/LabVIEW/best-way-to-measure-time/TD-p/178704

  and 2 external links:

  http://www.ehow.com/how_8698983_measure-time-LabVIEW.html

  http://objectmix.com/LabVIEW/385152-how-can-i-use-LabVIEW-measure-time-between-analog-pulses.html

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  Hello

  I use the DAQ-nor-6211 map and DAQmx features to read a hammer and a signal of the accelerometer and then use other LabView functions to make the FFT of these analog input signals. However, it seems that the analog inputs where the hammer and the accelerometer are connected generate a kind of noise or influence in other entries of this data that is not connected to any other sensor acquisition board.

  I've had different experiences in order to check if the problem is with reading the card: put the accelerometer and hit the dog in another table where the DAQ card table was located (to avoid the vibrations on the map and a possible noise), ai1 entry was logged on the differential mode on the dog and the ai4 of entry is connected to the output (z axis) of the accelerometer. The other 2 ai2 and ai3, entries that can also be read by my LabView program, are open (i. e., any other sensor is connected to the card). When the structure where the accelerometer is located is struck by the hammer, the signal of ai2 ("x axis" seen in the first attached document) has a curve (on the time domain) which initialize almost at the same time that the hammer and the a3 of entry has a weak signal, but with the swing as well as the signal of ai4. The document "hammer ai1 + z_axis connected_ _x_axis disconnected ai2 + y_axis ai3 ai4" images that I captured the chart created in LabView. On these graphs, it is possible to check on the FFT the ai3 signal and ai4 has the same behavior (with different intensities), and enlarged figure of time domain image, we can see that the signal of ai2 increase almost at the same time of the signal of the hammer (ai1). The signal picked up by the sensors are probably creating a sort of noise on open entries ai2 and ai3.

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  Finally, if the output of the accelerometer is connected on the ai2, the signal of the other open entries ai4 and ai7 seem to be affected by the signal of the accelerometer on ai2 (last document attached).

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  Thank you

  Maybe Ghosting or crosstalk? Just an idea.

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  The problem is that the configuration of I is made during execution by the operator.  Sometimes they want to acquire data on one HERE through all 6 cards SMU-6363, sometimes they want to acquire data on each channel of AI through all 6 cards SMU-6363.  What makes the task definition until manually route clock signals between devices for each rather difficult task.

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  Next, configure your task of analog input to use the sample clock output of the meter:

  

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