measurement of simulated ADC sinad

Similar Questions

• Where can I find the digital Thermometer.vi?

  I'm doing a base temperature read from a digital Thermometer.vi.  It's for my Test class Engineering and States of laboratory that it should not be a digital Thermometer.vi somewhere on my computer, however I had no luck in finding it.  I searched my computer and the internet for the VI and I had no chance.  "The laboratory said to go to this place on the pallet of functions"Works"tutorial" Digital Thermometer.vi "however I do not see even a submenu in the functions palette tutorial.  The vi is supposed to return a measure of simulated temperature.  What I do is plug the output of this vi to a chart in the form of wave that goes from 70 degrees F to 90 ° F.

  Someone know where I can find such VI?  If not, does anyone have one on their computer, they can publish?

  Thank you.

  Here's what I found in my Basics II one course there is a lot of time (it is written in LV8.0).  Maybe it'll do what you need.

• Question of Live View EOS 70 d

  Hello

  I just bought a 70 d EOS.  My question relates using Live View under "auto".  I understand that touch the display screen directly causes the camera to focus about to contact, and that's exactly what's happening on my camera.  However, I also noticed that exposure changes as well.  For example, if I touch a subject dark opening or time will change to allow for more light and vice versa if I touch a light object.

  I don't see any reference to this in the manual.  This is a very good feature, but I'd be curious to know where this feature is described in the manual, if anyone knows.

  Thank you

  D 70 has an iFCL 63-zone metering system. In other words, the area of the image you see in the viewfinder is divided into 63 different areas which are measured individually, with the collected info better interpreted the system and then used to get to what the camera "think" is a correct exposure.

  When in 'Auto', it probably uses so-called evaluative method. This method places more emphasis on the area immediately around the active AF point. It's kind of like one-off measure related to the focus area turns, but evaluative measure also considers the rest of the area of the image in its calculations.

  You probably also Simulation exhibition enabled (in fact it is not possible to turn it off using a fully automatic mode).

  If you were using a rather 'creatives' (as Canon calls) auto exposure modes, you would have more flexibility in the setting of the camera upwards. For example, you can choose a different method of counting (weighted Central don't react just like evaluative, simply examines the entire image area, with slightly more emphasis on the central part of the image, but without link to special AF point), or you could dial in some more or less using Exposure Compensation adjustment. AV, Tv and P is the automatic exposure modes 'creative '. AV means "Aperture priority" and is where you choose the opening and automation of the camera selects an appropriate shutter speed to match. TV stands for "Shutter priority", where you choose a shutter speed and the camera rule opening automatically. P is "programming mode", where the device regulates the opening and priority. (Note: in three modes, you would have chosen and ISO, first.)

  You could also disable Simulation exhibition, if you wish. Then the visible image on the LCD screen of the camera varies in the same way.

  However, I really do not pretend that you do not use evaluative measurement or Simulation of exposure. They are both valuable tools at your disposal. I suggest that you learn to use them to your advantage. Also become familiar with the camera's three other methods of counting (Center weighted, partial and Spot).

  Evaluative measure doesn't do a good job in a variety of situations. I suggest you learn to use it.

  First, try to think about the world in shades of gray, rather than colors. Like all the reflective metering systems, it was designed to produce a "neutral gray" and is influenced by the tone of the subject. For example, if you are shooting a black bear in a coal mine, the camera tries it overexposing. Or, if you are shooting a polar bear in a snow storm, the camera will try to underexpose it. In both cases, the metering system is still trying to be out "neutral grey". He can't think... to do the thinking and to recognize the situations where it will be shifted, skip it and make the appropriate adjustments.

  Simulation of exposure can help warn you of the top and bottom of the trends of the exhibition. You can also read your images and inspect the histogram, see if you over or underexposure issues, so that you can always re - draw the image if necessary.

  Note: more of what the camera offers there are other types of meters that work differently. For example, measure frequency measures the light falling on the subject, rather than what is reflected off of him (such as reflective metering). Used right, it can make for a more precise dosage. However, there is simply no practical way to build a frequency counter in a camera and use it for automatic exposure control. Frequency counters are for the most part separated, handheld and many of them are also able to measure with precision the flash and strobe lighting.

  It seems to me that if your device works just like it should. It's just a matter to become familiar with it and learn to use it.

  In addition to the manual that came with the camera, there are guides available that can be very useful and complete the manual. I suggest you to check what guides are out for 70 days. Whenever I have started working with a new model of camera I always buy one or two of the guides, as a shortcut to get up to speed using the camera. From personal experience, I can recommend guides by Charlotte Lowrie, Michael Guncheon and David Busch. If you are looking for 70 "d" on Amazon in the books, I'm sure you will find guides by one or several of these authors and probably a few other very good (some authors a few I know).

  If you are really new to photography, I also highly recommend getting a copy of "Understanding Exposure" by Bryan Peterson. It can also be very useful, and is more of a preview of the works the cameras in general. I think it should be mandatory reading for all new photographers, or at least for all those who want to move beyond the skill level of point-n-shoot.

  ***********
  Alan Myers

  San Jose, California, USA.
  «Market softly and carry a great lens.»
  MATERIAL: 5DII, 7D(x2), 50D(x3), some other cameras, various lenses & accessories
  FLICKR & REPROGRAPHY

• Is it possible to measure digital signals with devices of simulations?

  The simulated device configuration is the following:

  9174 chassis cDAQ (cDAQ1)

  -9215 (cDAQ1Mod1) (analog in)

  -9401 (cDAQ1Mod2) (digital i/o)

  With a digital line (e.g., line 4), I create a single pulse

  ------^---------....

  where the circumflex indicates the pulse short and simple.

  Is it possible to use a digital line (for example, the line 0) in to measure it in the device simulated using a kind of direct/indirect routing?  If so, how a set to the top of the digital input read task essentially read the output on line 4, internally?

  Thank you.

  N ° as the DAQmx help explains, you do not have this ability with a simulated device.

• Identification system measured by comparing with simulated

  Hello, I want to be able to match a simulated model

  a measure.

  I started with the release of a square to a lowpassfilter rc, and I measure of output.

  In parallel, I want to run the simulated reaction and if possible have the response simulated in the same graph.

  I also want to use Labviews built built-in functions somehow.

  Grateful for more help!

  PS Ce is not a homework problem, I'm not a student, I work as an instructor and I am a beginner with Labview.

  Shit! It works!

  I replaced the blocks in the block of simulation with Labview 2010 vi

  After pressing the stop button, I have the voltage of the rc-filter and simulated in the same graph!

  It's big!

  Thanks Barp!

• measure the speed of the fan in box vibration Simulator

  I'm trying to measure the analog speed towards the sbRIO

  I get a few signals pulse switching to 5v to 0v and vice versa with variable duty cycle...

  How can I calculate the speed of the fan

  values provided on the box of Simulator are

  Tach 2 pulses/revolution

  the maximum speed is 6,000 rpm

  Please help me with this...

  Did you look at the examples of LabVIEW? If you have installed the OR-DAQmx driver, you will find many examples showing how to do the counting of events or measures of frequency.

• How can you measure a wave of the ECG Simulator using a 6036e?

  I have an ECG Simulator I'd like to test. How I would setup a dac 6036E, scb - 68 card to test waveforms? Is there a screw that could help with this problem. Thank you.

  You're in luck.  NOR has a free biomedical Toolbox that should take you far: http://zone.ni.com/devzone/cda/tut/p/id/9037

  There is also a biomedical forum: http://decibel.ni.com/content/groups/biomedical-user-group

• Problem of Convergence HB in co-simulation EM-circuit

  Hello

  It would be really helpful if someone could take a look at the problem of simulation in the attached draft. I get errors from simulation - "step for source stepping size has declined under a permissible minimum value."and"poor convergence in the analysis of AC/DC (rel/abs err = 2,000 / 0.000) the biggest change (41) node in the node (46) maximum voltage = 53.076 minimum voltage in the node (MET_BASE!" _S12_LD1. R1.et) =-4.337 the biggest change in the branch (_S12_S1. I16) Maximum current in the industry (_S12_S1. I17) = 951,567 m current Minimum in the branch (MET_BASE! _S12_LD1.) R1. Bessel_L1. "(I) =-1735"

  Despite trying most of the suggested solutions enumerated using the particular error message, the problem persists. What I do wrong here in the configuration of the simulation?

  Thank you much in advance.

  You check the use frequency of the project on block of EXTRACT properties > frequencies tab.  So the structure of the MA is only simulated at frequencies of input: DC and not harmonics 5 simulation HB is taken into account.  So microwave Office must extrapolate at these frequencies. Your block EXTRACT frequencies should be defined to include 0, 1, 2, 3, 4 and 5 times each frequency simulation... .to you chanage the number of harmonics in the harmonic balance options.  You can also simply define the block EXTRACT sweep from 0 to 10 GHz.  Whatever it is, the simulation of EM will take more time, of course.  If AXIEM does not converge on a response, change the properties of block of EXTRACT > AXIEM tab, click the secondary Show button and under Advanced frequency sweeping (AFS), increase Max # sim points.

  For circuits that include models not linear, you must include the frequency = 0 even for linear measurements, for the accurate calculation of the DC polarization.

• General issues (iFilter, .syf and EM simulation environment)

  Hello!

  I have a few general questions, ranging from corresponding EM simulation symbol creation and design of network environment. I would be really grateful if someone could take some time to respond to these in as much detail as possible.

  (1) I use iMatch Wizard in iFilter to design the matching network of entry for the LNA and PA. But I noticed that I get the best correspondent for the LNA (verified by Zin measurement at the source of the device with the included matching network) when I do the correspondence for the combined impedance. However, in the case of the PA, this happens only if I design the network with the correct impedance and not its complex conjugate. Anyone know why this is the case? Or by popular practice, in which case the combined complex should be used for the corresponding network design?

  (2) how can I create my own .syf file to be used as a symbol for a system I design? If I have the .syf how do I appear in my list of existing library of symbols?

  (3) in the EM simulation environment, how to decide the spacing of the grid? Yet once, EMsight I cannot add ports in the structure of Employment, if the structure is not aligned with the grid. How to manage the grid alignment so that the ports are attached without worries? Also, in the EM structure is an available at the entrance x and is coordinated to a partciular shape/structure so that it will sit in the coordinates and will allow me to build the forms around him?

  I apologize for the length of the questions but get these deleted will help a lot!

  Thanks in advance!

  1. it is the plug.  You are probably using the gamma to the research in the output in the design of LNA (so your load must be combined), but using the desired gamma (manufacturer?) load design PA

  2. up to the v11, it's probably easier to just import the .syf in each project where you want to use: project > Circuit symbols > import symbol.  In v11, just help > show files/directories... > AppDataUser, create a folder named symbols and empty the file .syf in there.

  3 EMSight is ideal for the subset of the problems to which it applies, but otherwise it's pretty restrictive.  The ports must be on the limit, either on the walls or up/down drivers.  The latter requires a via, which does not incorporate to turn off automatically. etc.

  X and are grid sizes are defined in the enclosure.  When you draw, you can press the tab key to enter the coordinates manually.  However, I recommend that you check the mesh on the structure of your EM before you simulate to make sure that you are not shorting adjacent shapes, or decompose adjacent metal.  Download AXIEM, it blows EMSight out of the water.

• Large signal output capacitance measurements

  Hi all

  I'm working on a power amplifier and I want to measure the ability to output under large signal condition. I use a non-linear model of the GaN power transistor.

  Power output is about 36 dBm, f = 8.2 GHz

  I tried both methods:

  (1) I have spent under bias Vgs - 6V to 1V, Vds = 28V. I use solver C_PRC linear tab to find the parallel to the output capacity. I got a chart that changes from 0.3pF to 0.5pF. In this simulation I don't use tuner to impedance, just ports (50 ohm) and sources of bias.
  (2) amplifier is biased to 28V and 125mA. Then, I drive amplifier with of 20dBm to 30dBm input power. In this simulation, I used HBTUNERs to maximum power output (power input 25dBm at the entrance) and the output. I can see there is a change in capacity at the entrance vs input power change. However, in the output, production capacity is constant and 0.52pF. I am able the ability of the drain of transistors, tuner. I use great Solver for the parameter measuring signal Y and calculate the capacity.

  The interesting thing, I can meause entry changes easly to large signal capacity, but output capacity is constant!
  I have two questions:

  (1) why the three measures are different?

  (2) for large signal measurements, for example; 30dBm output, 30 v peak-to-peak output average 40dBm 50 v peak-to-peak. So, there is a change in capacity over a period of time. When I measure the Solver big signal, Solver uses the high peak values? If so, can I change low peak value?

  (3) can be used for important signals gamma probes?

  Thank you

  
  

• How to calculate time filter ADC for USB-4431

  I do a continuous measurement of the aregenerative AOAI.  I need to compensate for the delay of ADC filter both the delay in output filter

  The delay of output filter seems to be well documented in the manual NI DSA (link below)

  http://www.NI.com/PDF/manuals/371235g.PDF

  ADC filter delay is more difficult to find manual DSA says look at 443 x specifications.

  The specification gives a delay of "nominal" of 38 samples ADC filter.  I can't find a more precise definition (link below)

  http://www.NI.com/PDF/manuals/372485c.PDF

  I'm using labview 2010, on XP

  attached is a sample vi.  He uses a loop of producer consumer example that I modified

  I could manually find the total different sampling frequency offset, but I would have preferred a way to calculate it.

  Thank you

  Timm C.

  When you say 'calculate', mean you automatically measure, calculated by the formula, or search in the table?

  It's a good idea to measure the total delay (DAC + CDA + other) of the measuring device to each sampling frequency of measurement used in your application. Best practice is to run this measure whenever the system is powered up or rebooted.

  We recommend that you use VI provided by Sound and Vibration Toolkit to measure the delay and additional delays that may be introduced by the device under test:

  \vi.lib\addons\Sound and Vibration\svt_Calibration\SVL measure Propagation delay .vi (DAQmx)

  If you don't have a SVT/SVMS, you can recreate the measure of delay with LabVIEW complete edition features.

  Start to synchronize your AO and AI using the same implementation used in your application of measure.

  Use a test as a monopulse Gaussian signal and search for relaxation both the signal generated as well as the acquired signal. The difference between the locations of trigger is the delay.

  Or use a test signal as MLS or Chirp, and cross-correlation model to measure the delay.

  But I like to use the VI SVT ;-)

• measurement of current with usb-6009

  Hi, my name is hung and I am a student in electrical engineering... I'm doing a thesis that the project using Labview and acquisition of data NOR UBS-6009 to simulate the function generator, Oscilloscope, Digital Microsoft (DMM)... and now I'm simulating DMM. I managed to measure the voltage and resistance which i use voltage divider method, but I encountered a problem with the current measurement. The problem is the USB-6009 to measure use the current, it measures an incorrect value. I tried to use the current CQI 0-20mA Sample.vi example but it always measures an incorrect value. If NI USB-6009 supports for the measuring current? Is there a way to measure the currents using USB-6009? Please, help me. This thesis project is so important for me. Thank you.

  Hung,

  Since you are a student in electrical engineering, I'll show you how to know the answers to your questions.

  1. review the specifications for the USB-6009 case.  In particular look at the specifications of analog input.

  2. How would you measure current if you had only a voltmeter?  Use the same method with the USB-6009 case.  (Tip: apply the Ohm's law).

  General comment: when using any measuring instrument, always consider maximum permitted values at the entrances so that the instrument is not damaged

  and the measure is accurate.

  Let us know how you do.

  Lynn

• Pointing out that he / draining lithium with drums PXI Simulator?

  I now tools of NEITHER: NI SMU-1073 and SMU-4154. Before I used it as a simulator of battery development councils of power with power supplied by SMU-4154.

  However, now I would drain with a some models of drain to see the effect on his life of the lithium battery. I want to simulate the load of potential device that will power the battery.

  How can I empty real battery (for example, the smartphone) using my battery Simulator? Is this possible?

  Hi armendzh,

  No, unfortunately, it isn't. To drain a battery, you need a load, not another battery. The SMU-4154 operates in 2 quadrants. It can only original, not sink. She can get a positive and current or voltage current and negative voltage. A well has negative power, so it should work in the other two quadrants: positive voltage with negative current or current positive with a negative voltage (p = iv).

  What you need for your application, it is a variable load and something to measure the load and the battery. If you want to talk to someone about what to buy, just give us a call at the 866-275-6964 and create a new service request.

• Is it possible to get the value of the resistance of a circuit with NI USB-4065 USB without using studio measure?

  Hi, I'm working on a project where there partly to measure resistance values in different parts of the circuit. Now, the company where I work currently at wants to get the NI USB-4065 USB. I use visual studio 2005 c# to develop applications and I need to know if I needed measurement studio or are there drivers (dll) just to get the values of resistance and General measures of circuit. I have need the controls or anything, just to programatically read the NI USB-4065 USB key values when I need the application.

  Any help would be appreciated. Thank you.

  Yes, you can have several NI 4065 DMM in your system. When you use the API OR-DMM, you open the handles separately for each DMM by using its name. His name can be configured inside the measurement and Automation Explorer (MAX).

  In addition, you can go ahead and install OR DMM today. It is downloadable for free on ni.com. NOR-DMM (and most of the pilots NOR) supports the simulation. You go to MAX and create your simulated three 4065 s. Then you can start writing your program now. Since these devices are simulated, they will not return the real tensions (obviously) and that it won't react realistic hardware triggers if you use (obviously), but they are pretty close to the real deal to allow you to write a lot of code and become familiar with the API. No need to wait until you get the material - you can be really ready for it by using the simulation.

• Why do I get error "20019 ADC conversion failed" with my pci-6143, when I try to use the DIO lines?

  I am tyring to use one of the digital input lines on my PIC-6143 to go to the connection "enable" on the "write to file measure" vi.  I have two cards PCI-6143 acquiring analog signals of 8 channels per step, plus I have a digital DAQ assistant to the sample line of DIO 2 on one of the cards.  Normally I can start and stop recording using a signal of 5V to the DIO port several times until I get the error.

  Strangely, when I use a simple Boolean "Record" button at the port of the 'writing on a file as' enable vi, I never get this ADC error no matter how many times I press the button.

  I am including a screenshot of the error.

  Thank you

  Chris

  Please ignore this message.  The whole issue has been resolved by copying and pasting the VI in a new file in VI.  The new file ran perfectly.  Must have been a compilation of LabView or something error.